Journal Article FZJ-2019-01068

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A Novel Multiple Interface Structure with the Segregation of Dopants in Lead-Free Ferroelectric (K 0.5 Na 0.5 )NbO 3 Thin Films

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2018
Wiley-VCH Weinheim

Advanced materials interfaces 5(2), 1700972 - () [10.1002/admi.201700972]

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Abstract: Interfaces in oxides are found to possess different properties and can be engineered for modifying local structure and properties of nearby area. In this work, it is reported that the interfaces can be formed in Ba/Zr (BZ)‐doped (K,Na)NbO3 (KNN) thin films by cycles of chemical solution deposition using same precursor solution. In the films, a novel and special cross‐sectional structure is observed with periodic distribution of Ba‐rich and Zr‐rich layers. The Ba‐rich and Zr‐rich layers exhibit different strain, lattice parameters, and crystal structure, leading to an obvious effect on the general ferroelectric properties of the KNN‐based thin films. Moreover, the self‐polarization is also observed, which can be understood to originate from the formed built‐in field by layered distribution of Ba and Zr in the KNN‐BZ thin films.

Classification:

Contributing Institute(s):
  1. Physik Nanoskaliger Systeme (ER-C-1)
Research Program(s):
  1. 143 - Controlling Configuration-Based Phenomena (POF3-143) (POF3-143)

Appears in the scientific report 2018
Database coverage:
Medline ; Clarivate Analytics Master Journal List ; Current Contents - Physical, Chemical and Earth Sciences ; IF < 5 ; JCR ; SCOPUS ; Science Citation Index Expanded ; Web of Science Core Collection
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 Record created 2019-01-31, last modified 2021-01-30


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