Journal Article

FZJ-2019-01222

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png On the Use of Silicon Rubber Replica for Surface Topography Studies

Persson, J. S. ; Tiwari, A. ; Valbahs, E. ; Tolpekina, T. V. ; Persson, B. (Corresponding author)FZJ*

2018
Springer Science Business Media B.V. Dordrecht

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Please use a persistent id in citations: doi:10.1007/s11249-018-1092-0

Abstract: Silicone rubber is often used to obtain replica of surfaces which are hard to study directly. Here we discuss under what conditions engineering stylus measurements can be used to obtain the correct surface roughness from the replica. We also show how thin vertical slices of the silicone rubber can be used to obtain the surface roughness power spectra for the long-wavelength roughness on even very rough surfaces, such as road surfaces, which may be hard to probe directly with standard optical or stylus instruments.

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Contributing Institute(s):

1. Quanten-Theorie der Materialien (IAS-1)
2. Quanten-Theorie der Materialien (PGI-1)
3. JARA-FIT (JARA-FIT)
4. JARA - HPC (JARA-HPC)

Research Program(s):

1. 141 - Controlling Electron Charge-Based Phenomena (POF3-141) (POF3-141)

Appears in the scientific report 2018

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Database coverage:
; Clarivate Analytics Master Journal List ; Current Contents - Engineering, Computing and Technology ; Ebsco Academic Search ; IF < 5 ; JCR ; Nationallizenz ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Web of Science Core Collection

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