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| Home > Publications database > Investigation of hydrogen isotope retention mechanisms in beryllium: High resolution TPD measurements |
| Journal Article | FZJ-2021-01517 |
2019
Elsevier
Amsterdam [u.a.]
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Please use a persistent id in citations: http://hdl.handle.net/2128/27496 doi:10.1016/j.nme.2019.03.018
Abstract: The retention of ion-implanted deuterium in beryllium poly- and single crystals at room temperature is studied using high precision temperature programmed desorption spectroscopy (TPD). Slow temperature ramps of 0.01 K/s in combination with well-defined experimental conditions are used to resolve the low temperature desorption regime for the first time revealing three sharp desorption peaks. The comparison to results of a coupled reaction diffusion system (CRDS) model shows, that the corresponding release mechanisms cannot be described by thermally activated rate processes. SEM images of a polycrystalline beryllium sample after implantation of deuterium with 2 keV per D atom show the formation of blisters of roughly 1 µm in diameter. Additionally, cracks on top of the blisters are found as well as spots, on which blisters are peeled off. Both processes are discussed to play a role in the low temperature release regime of the retained deuterium. Investigation of TPD spectra performed on single crystalline beryllium shows a jagged pattern in the low temperature release regime, which can be connected to blisters bursting up, releasing big amounts of deuterium in short time scales.
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