Journal Article

FZJ-2021-04858

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png a -axis YBa 2 Cu 3 O 7− x /PrBa 2 Cu 3 O 7− x /YBa 2 Cu 3 O 7− x trilayers with subnanometer rms roughness

Suyolcu, Y. E. ; Sun, J. ; Goodge, B. H.Extern* ; Park, J. ; Schubert, J.FZJ* ; Kourkoutis, L. F. ; Schlom, D. G. (Corresponding author)Extern*

2021
AIP Publ. Melville, NY

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Please use a persistent id in citations: http://hdl.handle.net/2128/29404  doi:10.1063/5.0034648

Abstract: We demonstrate a-axis YBa 2 Cu 3 O 7−x /PrBa 2 Cu 3 O 7−x /YBa 2 Cu 3 O 7−x trilayers grown on (100) LaAlO 3 substrates with improved interfacesmoothness. The trilayers are synthesized by ozone-assisted molecular-beam epitaxy. The thickness of the PrBa 2 Cu 3 O 7−x layer is held con-stant at 8 nm, and the thickness of the YBa 2 Cu 3 O 7−x layers is varied from 24 nm to 100 nm. X-ray diffraction measurements show all trilayersto have >97% a-axis content. The rms roughness of the thinnest trilayer is <0.7 nm, and this roughness increases with the thickness of theYBa 2 Cu 3 O 7−x layers. The thickness of the YBa 2 Cu 3 O 7−x layers also affects the transport properties: while all samples exhibit an onset of thesuperconducting transition at and above 85 K, the thinner samples show wider transition widths, ΔT c . High-resolution scanning transmissionelectron microscopy reveals coherent and chemically sharp interfaces and that growth begins with a cubic (Y,Ba)CuO 3−x perovskite phase thattransforms into a-axis oriented YBa 2 Cu 3 O 7−x as the substrate temperature is ramped up.

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Contributing Institute(s):

1. Halbleiter-Nanoelektronik (PGI-9)

Research Program(s):

1. 5233 - Memristive Materials and Devices (POF4-523) (POF4-523)

Appears in the scientific report 2021

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