Journal Article

FZJ-2021-06150

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Sensitivity to crystal stacking in low-energy electron microscopy

Jugovac, M. (Corresponding author) ; Menteş, T. O. ; Genuzio, F. ; Lachnitt, J. ; Feyer, V.FZJ* ; Flege, J. I. ; Locatelli, A.

2021
Elsevier Amsterdam

This record in other databases:  

Please use a persistent id in citations: http://hdl.handle.net/2128/29875  doi:10.1016/j.apsusc.2021.150656

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Contributing Institute(s):

1. Elektronische Eigenschaften (PGI-6)

Research Program(s):

1. 5213 - Quantum Nanoscience (POF4-521) (POF4-521)

Appears in the scientific report 2021

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Database coverage:
; ; Clarivate Analytics Master Journal List ; Current Contents - Engineering, Computing and Technology ; Current Contents - Physical, Chemical and Earth Sciences ; Ebsco Academic Search ; Essential Science Indicators ; IF >= 5 ; JCR ; Nationallizenz ; SCOPUS ; Science Citation Index Expanded ; Web of Science Core Collection

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