Journal Article

FZJ-2022-04436

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Direct measurement of band offsets on selective area grown In 0.53 Ga 0.47 As/InP heterojunction with multiple probe scanning tunneling microscopy

Peric, N. (Corresponding author) ; Durand, C. (Corresponding author) ; Berthe, M. ; Lu, Y.FZJ* ; N'Konou, K. ; Coratger, R. ; Lefebvre, I. ; Ebert, P.FZJ* ; Biadala, L. ; Desplanque, L. ; Wallart, X. ; Grandidier, B.

2022
American Inst. of Physics Melville, NY

This record in other databases:  

Please use a persistent id in citations: http://hdl.handle.net/2128/32704  doi:10.1063/5.0104807

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Contributing Institute(s):

1. Physik Nanoskaliger Systeme (ER-C-1)

Research Program(s):

1. 5351 - Platform for Correlative, In Situ and Operando Characterization (POF4-535) (POF4-535)

Appears in the scientific report 2022

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Database coverage:
; ; Clarivate Analytics Master Journal List ; Current Contents - Electronics and Telecommunications Collection ; Current Contents - Physical, Chemical and Earth Sciences ; Ebsco Academic Search ; Essential Science Indicators ; IF < 5 ; JCR ; National-Konsortium ; Nationallizenz ; PubMed Central ; SCOPUS ; Science Citation Index Expanded ; Web of Science Core Collection

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