Journal Article

FZJ-2023-05616

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Lattice Deformation at Submicron Scale: X-Ray Nanobeam Measurements of Elastic Strain in Electron Shuttling Devices

Corley-Wiciak, C. (Corresponding author) ; Zoellner, M. H. ; Zaitsev, I. ; Anand, K. ; Zatterin, E. ; Yamamoto, Y. ; Corley-Wiciak, A. A. ; Reichmann, F. ; Langheinrich, W. ; Schreiber, L.FZJ* ; Manganelli, C. L. ; Virgilio, M. ; Richter, C.FZJ* ; Capellini, G.

2023
American Physical Society College Park, Md. [u.a.]

This record in other databases:    

Please use a persistent id in citations: doi:10.1103/PhysRevApplied.20.024056  doi:10.34734/FZJ-2023-05616

---

Contributing Institute(s):

1. JARA Institut Quanteninformation (PGI-11)

Research Program(s):

1. 5221 - Advanced Solid-State Qubits and Qubit Systems (POF4-522) (POF4-522)

Appears in the scientific report 2023

---

Database coverage:
; ; ; Clarivate Analytics Master Journal List ; Current Contents - Physical, Chemical and Earth Sciences ; IF < 5 ; JCR ; SCOPUS ; Web of Science Core Collection

---