Journal Article FZJ-2024-02136

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A direct measure of positive feedback loop-gain due to reverse bias damage in thin-film solar cells using lock-in thermography

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2023
EDP Sciences Les Ulis

EPJ Photovoltaics 14, 3 - () [10.1051/epjpv/2022030]

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Contributing Institute(s):
  1. Photovoltaik (IEK-5)
Research Program(s):
  1. 1215 - Simulations, Theory, Optics, and Analytics (STOA) (POF4-121) (POF4-121)

Appears in the scientific report 2024
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Creative Commons Attribution CC BY 4.0 ; DOAJ ; OpenAccess ; Article Processing Charges ; Clarivate Analytics Master Journal List ; DOAJ Seal ; Ebsco Academic Search ; Emerging Sources Citation Index ; Fees ; IF < 5 ; JCR ; SCOPUS ; Web of Science Core Collection
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Dokumenttypen > Aufsätze > Zeitschriftenaufsätze
Institutssammlungen > IMD > IMD-3
Workflowsammlungen > Öffentliche Einträge
IEK > IEK-5
Publikationsdatenbank
Open Access

 Datensatz erzeugt am 2024-03-28, letzte Änderung am 2025-02-03


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