Journal Article

FZJ-2025-02335

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Automated Endurance Characterization of Phase Change Memory

Padberg, H. ; Espiari, A.FZJ* ; Schnieders, K.FZJ* ; Kiehn, A.FZJ* ; Jalil, A. R.FZJ* ; Waser, R.FZJ* ; Menzel, S.FZJ* ; Wiefels, S.FZJ*

2025
IEEE New York, NY

This record in other databases:  

Please use a persistent id in citations: doi:10.1109/ACCESS.2025.3562434  doi:10.34734/FZJ-2025-02335

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Contributing Institute(s):

1. Elektronische Materialien (PGI-7)
2. JARA Institut Green IT (PGI-10)

Research Program(s):

1. 5233 - Memristive Materials and Devices (POF4-523) (POF4-523)
2. BMBF 16ME0398K - Verbundprojekt: Neuro-inspirierte Technologien der künstlichen Intelligenz für die Elektronik der Zukunft - NEUROTEC II - (BMBF-16ME0398K) (BMBF-16ME0398K)

Appears in the scientific report 2025

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Database coverage:
; ; ; ; Article Processing Charges ; Clarivate Analytics Master Journal List ; Current Contents - Electronics and Telecommunications Collection ; Current Contents - Engineering, Computing and Technology ; DOAJ Seal ; Essential Science Indicators ; Fees ; IF < 5 ; JCR ; SCOPUS ; Science Citation Index Expanded ; Web of Science Core Collection

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