Journal Article

FZJ-2025-05802

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Optimizing time-of-flight secondary ion mass spectrometry depth profiles of semiconductor heterostructures

Tröger, J. (Corresponding author) ; Kersting, R. ; Hagenhoff, B. ; Bougeard, D. ; Abrosimov, N. V. ; Klos, J. ; Schreiber, L.FZJ* ; Bracht, H.

2025
American Inst. of Physics Melville, NY

This record in other databases:  

Please use a persistent id in citations: doi:10.1063/5.0232252  doi:10.34734/FZJ-2025-05802

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Contributing Institute(s):

1. JARA Institut Quanteninformation (PGI-11)

Research Program(s):

1. 5221 - Advanced Solid-State Qubits and Qubit Systems (POF4-522) (POF4-522)

Appears in the scientific report 2025

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Database coverage:
; ; ; Clarivate Analytics Master Journal List ; Current Contents - Electronics and Telecommunications Collection ; Current Contents - Physical, Chemical and Earth Sciences ; Ebsco Academic Search ; Essential Science Indicators ; IF < 5 ; JCR ; National-Konsortium ; SCOPUS ; Science Citation Index Expanded ; Web of Science Core Collection

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