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High mobility strained SOI MOSFETs with LaScO3/TiN gate stacks fabricated with a replacement gate process
 Durgun Özben, E.FZJ* ;  Lopes, J. M. J.FZJ* ;  Roeckerath, M.FZJ* ;  Nichau, A.FZJ* ;  Luptak, R.FZJ* ;  Lenk, S.FZJ* ;  Besmehn, A. ;  Ghyselen, B.FZJ* ;  Zhao, Q. T.FZJ* ;  Schubert, J.FZJ* ;  Mantl, S.FZJ*
2010
  
  201011thb International Conference on Ultimate Integratuin on Silicon (ULIS)
Seminar, Glasgow, ScotlandGlasgow, Scotland, 18 Mar 20102010-03-18
  
  
  
  
  
  
Note: Record converted from VDB: 12.11.2012 
Contributing Institute(s): 
- Halbleiter-Nanoelektronik (IBN-1)
- Jülich-Aachen Research Alliance - Fundamentals of Future Information Technology (JARA-FIT)
Research Program(s): 
- Grundlagen für zukünftige Informationstechnologien (P42)
Appears in the scientific report 
2010