Contribution to a conference proceedings FZJ-2013-00881

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Tuning the spectral sensitivity of vertical InN nanopyramid based photodetectors by means of band gap engineering and/or nanostructure size control

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2012
IEEE
ISBN: 978-1-4673-1195-3

The Ninth International Conference on Advanced Semiconductor Devices and Microsystems, ASDAM, SmoleniceSmolenice, Slovakia, 11 Nov 2012 - 15 Nov 20122012-11-112012-11-15 IEEE 320 p () special issue: "Proceedings of The Ninth International Conference on Advanced Semiconductor Devices and Microsystems" (978-1-4673-1195-3)

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Abstract: We fabricated and tested InN nanopyramid based photodetectors designed for operation in the telecommunication-wavelength range. We found that the spectral sensitivity of InN photodetectors can be engineered by their size and by the strain interaction with the masked SiO2/GaN substrates. The band edge luminescence energy of the InN nanopyramids depends linearly on the structure size. Furthermore, InN nanopyramid based photodetectors exhibit a low device RC constant, low dark currents below 1 nA, as well as a responsivity of ~ 0.2 A/W at 1550 nm wavelength. InN nanopyramid based photodetectors are very promising candidates for high-speed optoelectronics within the telecommunication wavelength range.


Contributing Institute(s):
  1. Elektronische Eigenschaften (PGI-6)
  2. Halbleiter-Nanoelektronik (PGI-9)
  3. Jülich-Aachen Research Alliance - Fundamentals of Future Information Technology (JARA-FIT)
  4. PGI-8-PT (PGI-8-PT)
Research Program(s):
  1. 423 - Sensorics and bioinspired systems (POF2-423) (POF2-423)

Appears in the scientific report 2012
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 Record created 2013-01-24, last modified 2021-01-29



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