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| Hauptseite > Publikationsdatenbank > Interfacial defects in YBa $_{2}$ Cu $_{3}$ O $_{7-δ}$ /SrTiO $_{3} (0 0 1) heterostructures studied by aberration-corrected ultrahigh-resolution electron microscopy |
| Hauptseite > Publikationsdatenbank > Interfacial defects in YBa $_{2}$ Cu $_{3}$ O $_{7-δ}$ /SrTiO $_{3} (0 0 1) heterostructures studied by aberration-corrected ultrahigh-resolution electron microscopy |
| Journal Article | FZJ-2015-03909 |
2013
Taylor & Francis
London [u.a.]
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Please use a persistent id in citations: doi:10.1080/09500839.2013.765975
Abstract: The microstructure of interfacial defects in YBa2Cu3O7-δ/SrTiO3(0 0 1) heterostructures has been investigated by aberration-corrected ultrahigh-resolution electron microscopy. We determine that c-axis-oriented YBa2Cu3O7-δ thin films epitaxially grow on SrTiO3(0 0 1) with two types of interface structure. The coalescence of nucleation sites with different types of interface structure leads to the formation of antiphase domain boundaries in YBa2Cu3O7-δ thin films, which terminate at planar faults with different configurations near the interface. Stand-off misfit dislocations are observed and the dislocation core structure is explored. Based on the interface structure and interfacial defects, the initial growth mode of YBa2Cu3O7-δ thin films on SrTiO3(0 0 1) is discussed.
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