Journal Article FZJ-2016-00635

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Scanning Quantum Dot Microscopy

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2015
APS College Park, Md.

Physical review letters 115(2), 026101 () [10.1103/PhysRevLett.115.026101]

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Abstract: We introduce a scanning probe technique that enables three-dimensional imaging of local electrostatic potential fields with subnanometer resolution. Registering single electron charging events of a molecular quantum dot attached to the tip of an atomic force microscope operated at 5 K, equipped with a qPlus tuning fork, we image the quadrupole field of a single molecule. To demonstrate quantitative measurements, we investigate the dipole field of a single metal adatom adsorbed on a metal surface. We show that because of its high sensitivity the technique can probe electrostatic potentials at large distances from their sources, which should allow for the imaging of samples with increased surface roughness.

Classification:

Contributing Institute(s):
  1. Funktionale Nanostrukturen an Oberflächen (PGI-3)
  2. JARA-FIT (JARA-FIT)
  3. John von Neumann - Institut für Computing (NIC)
Research Program(s):
  1. 141 - Controlling Electron Charge-Based Phenomena (POF3-141) (POF3-141)
  2. Spectra of 2D layered materials (hms17_20140501) (hms17_20140501)

Appears in the scientific report 2015
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Medline ; Creative Commons Attribution CC BY 3.0 ; OpenAccess ; Current Contents - Physical, Chemical and Earth Sciences ; IF >= 5 ; JCR ; NCBI Molecular Biology Database ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection
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 Record created 2016-01-18, last modified 2022-09-30