Conference Presentation (Other)

FZJ-2016-00689

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Characterization of TaOx Resistive Switching Memory Devices by Scanning Tunneling Microscopy

Adepalli, K. K. (Corresponding author) ; Moors, M.FZJ* ; Lu, Q. ; Wedig, A.FZJ* ; Waser, R.FZJ* ; Tuller, H. L. ; Valov, I.FZJ* ; Yildiz, B.

2015

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Contributing Institute(s):

1. Elektronische Materialien (PGI-7)

Research Program(s):

1. 521 - Controlling Electron Charge-Based Phenomena (POF3-521) (POF3-521)

Appears in the scientific report 2015

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Database coverage:
No Authors Fulltext

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