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Journal Article | PreJuSER-50521 |
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2006
American Institute of Physics
Melville, NY
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Please use a persistent id in citations: http://hdl.handle.net/2128/1432 doi:10.1063/1.2171485
Abstract: The structural and electronic properties of MnxGe1-x alloys (x <= 0.15) fabricated by ion implantation are investigated by means of x-ray diffraction and synchrotron radiation photoemission spectroscopy. The diffraction patterns point to the presence of ferromagnetic Mn5Ge3 nanoparticles; however, valence band spectra, interpreted by means of accurate ab initio calculations including Hubbard-like correlations, show clear fingerprints of an effective substitutional Mn dilution in the Ge semiconducting host. (c) 2006 American Institute of Physics.
Keyword(s): J
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