Home > Publications database > Structural properties of microcrystalline SiC deposited at low substrate temperatures by HWCVD
 
Conference Presentation PreJuSER-50526
http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png
Structural properties of microcrystalline SiC deposited at low substrate temperatures by HWCVD

 ;  ;  ;  ;

2005

21st International Conference on Amorphous and Nanocrystalline Semiconductors (ICANS21)
Seminar, LisboaLisboa, 4 Sep 20052005-09-04


Note: Record converted from VDB: 12.11.2012
Contributing Institute(s):
  1. Werkstoffsynthese und Herstellungsverfahren (IWV-1)
  2. Institut für Photovoltaik (IPV)
Research Program(s):
  1. Photovoltaik (E02)

Appears in the scientific report 2005
Notes: Nachtrag
Click to display QR Code for this record

The record appears in these collections:
Document types > Presentations > Conference Presentations
Institute Collections > IMD > IMD-2
Institute Collections > IMD > IMD-3
Workflow collections > Public records
IEK > IEK-1
IEK > IEK-5
Publications database
 Record created 2012-11-13, last modified 2024-07-08
Similar records



Rate this document:

Rate this document:
1
2
3
4
5
 
(Not yet reviewed)
JuSER :: Search :: Submit :: Personalize :: Help
Powered by Invenio v1.1.7 | join2_v2512
Maintained by juser@fz-juelich.de

Impressum | Data Privacy Policy
This site is also available in the following languages:
Deutsch  English