Conference Presentation (Other)

FZJ-2019-00047

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Impact of Traps in Ferroelectric HfYOx on Negative Capacitance MOSFETs

Han, Q.FZJ* ; Tromm, T. C. U.FZJ* ; Aleksa, P.FZJ* ; Schubert, J.FZJ* ; Mantl, S.FZJ* ; Zhao, Q.-T. (Corresponding author)FZJ*

2018

Note: Extended Abstract

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Contributing Institute(s):

1. Halbleiter-Nanoelektronik (PGI-9)

Research Program(s):

1. 521 - Controlling Electron Charge-Based Phenomena (POF3-521) (POF3-521)

Appears in the scientific report 2018

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