Journal Article

FZJ-2022-00246

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Coincidence Detection of EELS and EDX Spectral Events in the Electron Microscope

Jannis, D. (Corresponding author)Extern* ; Müller-Caspary, K. (Corresponding author)FZJ* ; Béché, A.Extern* ; Verbeeck, J.Extern*

2021
MDPI Basel

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Please use a persistent id in citations: http://hdl.handle.net/2128/30148  doi:10.3390/app11199058

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Contributing Institute(s):

1. Physik Nanoskaliger Systeme (ER-C-1)

Research Program(s):

1. 5351 - Platform for Correlative, In Situ and Operando Characterization (POF4-535) (POF4-535)
2. ESTEEM3 - Enabling Science and Technology through European Electron Microscopy (823717) (823717)
3. FWO - Reglement des Fonds für wissenschaftliche Forschung - Flandern als Reglement von Forschungsprojekten Grundlagenforschung (G042920N) (G042920N)
4. moreSTEM - Momentum-resolved Scanning Transmission Electron Microscopy (VH-NG-1317) (VH-NG-1317)

Appears in the scientific report 2021

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