Journal Article FZJ-2022-04494

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Inverse Multislice Ptychography by Layer-wise Optimisation and Sparse Matrix Decomposition

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2022
IEEE [New York, NY]

IEEE transactions on computational imaging 8, 996 - 1011 () [10.1109/TCI.2022.3218993]

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Abstract: We propose algorithms based on an optimisation method for inverse multislice ptychography in, e.g. electron microscopy. The multislice method is widely used to model the interaction between relativistic electrons and thick specimens. Since only the intensity of diffraction patterns can be recorded, the challenge in applying inverse multislice ptychography is to uniquely reconstruct the electrostatic potential in each slice up to some ambiguities. In this conceptual study, we show that a unique separation of atomic layers for simulated data is possible when considering a low acceleration voltage. We also introduce an adaptation for estimating the illuminating probe. For the sake of practical application, we finally present slice reconstructions using experimental 4D scanning transmission electron microscopy (STEM) data.

Classification:

Contributing Institute(s):
  1. Physik Nanoskaliger Systeme (ER-C-1)
Research Program(s):
  1. 5351 - Platform for Correlative, In Situ and Operando Characterization (POF4-535) (POF4-535)
  2. moreSTEM - Momentum-resolved Scanning Transmission Electron Microscopy (VH-NG-1317) (VH-NG-1317)
  3. Ptychography 4.0 - Proposal for a pilot project "Information & Data Science" (ZT-I-0025) (ZT-I-0025)
  4. EDARTI - Electron Diffraction Inversion by Artificial Intelligence Approaches (ZT-I-PF-Z5-28) (ZT-I-PF-Z5-28)

Appears in the scientific report 2022
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Medline ; Creative Commons Attribution CC BY 4.0 ; OpenAccess ; Clarivate Analytics Master Journal List ; Current Contents - Engineering, Computing and Technology ; Essential Science Indicators ; IF < 5 ; JCR ; SCOPUS ; Science Citation Index Expanded ; Web of Science Core Collection
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 Record created 2022-11-09, last modified 2023-01-23