| Home > Publications database > Modeling and design of GeSn avalanche photodiodes with high tin content for applications at 3.3 μm |
| Journal Article | FZJ-2024-05185 |
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2024
IEEE
New York, NY
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Please use a persistent id in citations: doi:10.1109/JSTQE.2024.3439495 doi:10.34734/FZJ-2024-05185
Abstract: We propose and compare two back-side illuminated GeSn avalanche photodiode (APD) mesa structures with 15% tin content operating at photon wavelengths up to 3.3 μm, suitable for applications like methane gas sensing and analysis of tampered olive oil. The two structures have different multiplication materials: a) silicon, which requires an additional Ge Strain-Relaxed Buffer (SRB) layer for high-quality GeSn growth; b) germanium, which is acting also as SRB layer. The latter design is innovative compared to the state-of-the-art and it proposed to: i) reduce the space charge region (SCR) width by avoiding a too thick Ge SRB, which is required for growing high-tin-content GeSn; ii) avoid one supplementary non-lattice matched heterojunction in the SCR.
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