Journal Article

FZJ-2024-07014

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Experimental Verification and Evaluation of Non-Stateful Logic Gates in Resistive RAM

Brackmann, L.FZJ* ; Ziegler, T. ; Wouters, D. J. ; Menzel, S.FZJ*

2025
Institute of Electrical and Electronics Engineers New York, NY

This record in other databases:    

Please use a persistent id in citations: doi:10.1109/TCSI.2024.3486376  doi:10.34734/FZJ-2024-07014

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Contributing Institute(s):

1. Elektronische Materialien (PGI-7)
2. JARA-FIT (JARA-FIT)

Research Program(s):

1. 5233 - Memristive Materials and Devices (POF4-523) (POF4-523)
2. DFG project G:(GEPRIS)422738993 - SPP 2262: Memristive Bauelemente für intelligente technische Systeme (422738993) (422738993)
3. BMBF 16ME0399 - Verbundprojekt: Neuro-inspirierte Technologien der künstlichen Intelligenz für die Elektronik der Zukunft - NEUROTEC II - (BMBF-16ME0399) (BMBF-16ME0399)
4. BMBF 16ME0398K - Verbundprojekt: Neuro-inspirierte Technologien der künstlichen Intelligenz für die Elektronik der Zukunft - NEUROTEC II - (BMBF-16ME0398K) (BMBF-16ME0398K)
5. BMBF 03ZU1106AA - NeuroSys: Memristor Crossbar Architekturen (Projekt A) - A (03ZU1106AA) (03ZU1106AA)
6. BMBF 03ZU1106AB - NeuroSys: "Memristor Crossbar Architekturen (Projekt A) - B" (BMBF-03ZU1106AB) (BMBF-03ZU1106AB)

Appears in the scientific report 2025

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Database coverage:
; ; ; Clarivate Analytics Master Journal List ; Current Contents - Electronics and Telecommunications Collection ; Current Contents - Engineering, Computing and Technology ; Ebsco Academic Search ; Essential Science Indicators ; IF >= 5 ; JCR ; NCBI Molecular Biology Database ; SCOPUS ; Science Citation Index Expanded ; Web of Science Core Collection

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