Journal Article

FZJ-2016-00630

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Scanning tunneling potentiometry implemented into a multi-tip setup by software

Lüpke, F. (Corresponding author)FZJ* ; Korte, S.FZJ* ; Cherepanov, V.FZJ* ; Voigtländer, B.FZJ*

2015
American Institute of Physics [S.l.]

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Please use a persistent id in citations: http://hdl.handle.net/2128/16729  doi:10.1063/1.4936079

Abstract: We present a multi-tip scanning tunneling potentiometry technique that can be implemented into existing multi-tip scanning tunneling microscopes without installation of additional hardware. The resulting setup allows flexible in situ contacting of samples under UHV conditions and subsequent measurement of the sample topography and local electric potential with resolution down to Å and μV, respectively. The performance of the potentiometry feedback is demonstrated by thermovoltage measurements on the Ag/Si(111)−(3√×3√)R30∘Ag/Si(111)−(3×3)R30∘surface by resolving a standing wave pattern. Subsequently, the ability to map the local transport field as a result of a lateral current through the sample surface is shown on Ag/Si(111)−(3√×3√)R30∘Ag/Si(111)−(3×3)R30∘ and Si(111) − (7 × 7) surfaces.

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Contributing Institute(s):

1. Funktionale Nanostrukturen an Oberflächen (PGI-3)

Research Program(s):

1. 141 - Controlling Electron Charge-Based Phenomena (POF3-141) (POF3-141)

Appears in the scientific report 2015

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Database coverage:
; ; Current Contents - Engineering, Computing and Technology ; Current Contents - Physical, Chemical and Earth Sciences ; IF < 5 ; JCR ; Nationallizenz ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection

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