Journal Article

PreJuSER-50808

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Mechanical Crosstalk between Vertical and Lateral Piezoresponse Force Microscopy

Peter, F.FZJ* ; Rüdiger, A.FZJ* ; Waser, R.FZJ*

2006
American Institute of Physics [S.l.]

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Please use a persistent id in citations: http://hdl.handle.net/2128/1025  doi:10.1063/1.2176081

Abstract: Piezoresponse force microscopy (PFM) provides valuable insight into the inverse lateral and vertical piezoelectric effects on the nanoscale. Ideally, these contributions are separated into vertical and lateral detections of a deflected laser beam on a quadrupole diode. In contrast to the known crosstalk by a rotated diode that causes identical signals in both channels, we report on the crosstalk due to the geometrical constraints of the cantilever that is inherent to the lateral PFM. For a BaTiO3 (001) nanograin we show that the vertical response attributable to the crosstalk is 1/8th of the lateral response. From this value we deduce the actual mechanism responsible for the crosstalk. (c) 2006 American Institute of Physics.

Keyword(s): J

Note: Record converted from VDB: 12.11.2012

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Contributing Institute(s):

1. Elektronische Materialien (IFF-IEM)
2. Center of Nanoelectronic Systems for Information Technology (CNI)
3. Jülich-Aachen Research Alliance - Fundamentals of Future Information Technology (JARA-FIT)

Research Program(s):

1. Grundlagen für zukünftige Informationstechnologien (P42)

Appears in the scientific report 2006
Notes: This version is available at the following Publisher URL: http://rsi.aip.org

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