Journal Article

PreJuSER-62884

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Direct electrical characterization of embedded ferroelectric lead titanate nanoislands

Clemens, S. ; Dippel, A. C. ; Schneller, T. ; Waser, R.FZJ* ; Rüdiger, A.FZJ* ; Röhrig, S.FZJ*

2008
American Institute of Physics Melville, NY

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Please use a persistent id in citations: http://hdl.handle.net/2128/17112  doi:10.1063/1.2838346

Abstract: We report on the fabrication and characterization of lead titanate nanoislands on platinized silicon substrates embedded into a low-k dielectric. Our findings with Pt and Au as collective top electrodes are compared to previous results and thin films, and we discuss the coercive field and the remanent polarization with special care devoted to capacitive and leakage contributions of the nonpolar matrix. A direct electrical characterization of sub-100-nm ferroelectric nanoislands becomes feasible if they are measured in parallel, providing that the thin film material parameters of both ferroelectric and spin-on glass are independently determined. (c) 2008 American Institute of Physics.

Keyword(s): J

Note: Record converted from VDB: 12.11.2012

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Contributing Institute(s):

1. Elektronische Materialien (IFF-6)
2. Jülich-Aachen Research Alliance - Fundamentals of Future Information Technology (JARA-FIT)

Research Program(s):

1. Grundlagen für zukünftige Informationstechnologien (P42)

Appears in the scientific report 2008

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