Journal Article

FZJ-2017-03896

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Schottky barrier tuning via dopant segregation in NiGeSn-GeSn contacts

Schulte-Braucks, C. (Corresponding author)FZJ* ; Hofmann, E.FZJ* ; Glass, S.FZJ* ; von den Driesch, N.FZJ* ; Mussler, G.FZJ* ; Breuer, U.FZJ* ; Hartmann, J.-M. ; Zaumseil, P. ; Schröder, T. ; Zhao, Q.-T.FZJ* ; Mantl, S.FZJ* ; Buca, D.FZJ*

2017
American Inst. of Physics Melville, NY

This record in other databases:    

Please use a persistent id in citations: http://hdl.handle.net/2128/16841  doi:10.1063/1.4984117

Abstract: We present a comprehensive study on the formation and tuning of the Schottky barrier of NiGeSn metallic alloys on Ge1-xSnx semiconductors. First, the Ni metallization of GeSn is investigated for a wide range of Sn contents (x = 0–0.125). Structural analysis reveals the existence of different poly-crystalline NiGeSn and Ni3(GeSn)5 phases depending on the Sn content. Electrical measurements confirm a low NiGeSn sheet resistance of 12 Ω/□ almost independent of the Sn content. We extracted from Schottky barrier height measurements in NiGeSn/GeSn/NiGeSn metal-semiconductor-metal diodes Schottky barriers for the holes below 0.15 eV. They decrease with the Sn content, thereby confirming NiGeSn as an ideal metal alloy for p-type contacts. Dopant segregation for both p- and n-type dopants is investigated as a technique to effectively modify the Schottky barrier of NiGeSn/GeSn contacts. Secondary ion mass spectroscopy is employed to analyze dopant segregation and reveal its dependence on both the Sn content and biaxial layer strain.

---

Contributing Institute(s):

1. Halbleiter-Nanoelektronik (PGI-9)
2. Analytik (ZEA-3)

Research Program(s):

1. 521 - Controlling Electron Charge-Based Phenomena (POF3-521) (POF3-521)
2. E2SWITCH - Energy Efficient Tunnel FET Switches and Circuits (619509) (619509)

Appears in the scientific report 2017

---

Database coverage:
; ; Current Contents - Physical, Chemical and Earth Sciences ; Ebsco Academic Search ; IF < 5 ; JCR ; Nationallizenz ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection

---