Conference Presentation (After Call)

FZJ-2019-01810

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Verification of a 65nm CMOS IC for various applications (neutrino detection, high energy physics, etc.)

Roth, C. (Corresponding author)FZJ* ; van Waasen, S.FZJ*

2018

Please use a persistent id in citations: http://hdl.handle.net/2128/22865

Abstract: Verification of a 65nm CMOS IC for various applications (neutrino detection, high energy physics, etc.)

Keyword(s): Instrument and Method Development (1st) ; Instrument and Method Development (2nd)

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Contributing Institute(s):

1. Zentralinstitut für Elektronik (ZEA-2)

Research Program(s):

1. 632 - Detector technology and systems (POF3-632) (POF3-632)

Appears in the scientific report 2019

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Database coverage:

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