Hauptseite > Publikationsdatenbank > Mapping and statistics of ferroelectric domain boundary angles and types |
Journal Article | PreJuSER-18764 |
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2011
American Institute of Physics
Melville, NY
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Please use a persistent id in citations: http://hdl.handle.net/2128/7374 doi:10.1063/1.3643155
Abstract: Ferroelectric domain orientations have been mapped using piezo-force microscopy, allowing the calculation and statistical analysis of interfacial polarization angles, the head-to-tail or head-to-head configuration, and any cross-coupling terms. Within 1 mu m(2) of an epitaxial (001)(p)-oriented BiFeO3 film, there are >40 mu m of linear domain boundary based on over 500 interfaces. 71 degrees domain walls dominate the interfacial polarization angles, with a 2:1 preference for uncharged head-to-tail versus charged head-to-head boundary types. This mapping technique offers a unique perspective on domain boundary distributions, important for ferroelectric and multiferroic applications where domain wall parameters are critical. (C) 2011 American Institute of Physics. [doi:10.1063/1.3643155]
Keyword(s): J ; bismuth compounds (auto) ; dielectric polarisation (auto) ; electric domain walls (auto) ; epitaxial layers (auto) ; ferroelectric materials (auto) ; ferroelectric thin films (auto) ; multiferroics (auto) ; scanning probe microscopy (auto)
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