Journal Article FZJ-2016-00629

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Surface and Step Conductivities on Si(111) Surfaces

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2015
APS College Park, Md.

Physical review letters 115(6), 066801 () [10.1103/PhysRevLett.115.066801]

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Abstract: Four-point measurements using a multitip scanning tunneling microscope are carried out in order to determine surface and step conductivities on Si(111) surfaces. In a first step, distance-dependent four-point measurements in the linear configuration are used in combination with an analytical three-layer model for charge transport to disentangle the 2D surface conductivity from nonsurface contributions. A termination of the Si(111) surface with either Bi or H results in the two limiting cases of a pure 2D or 3D conductance, respectively. In order to further disentangle the surface conductivity of the step-free surface from the contribution due to atomic steps, a square four-probe configuration is applied as a function of the rotation angle. In total, this combined approach leads to an atomic step conductivity of σstep=(29±9)  Ω−1 m−1 and to a step-free surface conductivity of σsurf=(9±2)×10−6  Ω−1/□ for the Si(111)−(7×7) surface.

Classification:

Contributing Institute(s):
  1. Funktionale Nanostrukturen an Oberflächen (PGI-3)
  2. JARA-FIT (JARA-FIT)
Research Program(s):
  1. 141 - Controlling Electron Charge-Based Phenomena (POF3-141) (POF3-141)

Appears in the scientific report 2015
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Medline ; Creative Commons Attribution CC BY 3.0 ; OpenAccess ; Current Contents - Physical, Chemical and Earth Sciences ; IF >= 5 ; JCR ; NCBI Molecular Biology Database ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection
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 Record created 2016-01-18, last modified 2022-09-30