Journal Article PreJuSER-5727

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Hard X-Ray Microscopy with Elemental, Chemical, and Structural Contrast

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2010
Acad. Inst. Warsaw

ACTA PHYSICA POLONICA A 2010 (2), Vol. 117, 357 Acta physica Polonica / A 117, 357 - 368 ()

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Abstract: We review hard X-ray microscopy techniques with a focus on scanning microscopy with synchrotron radiation. Its strength compared to other microscopies is the large penetration depth of hard x rays in matter that allows one to investigate the interior of an object without destructive sample preparation. In combination with tomography, local information from inside of a specimen can be obtained, even from inside special non-ambient sample environments. Different X-ray analytical techniques can be used to produce contrast, such as X-ray absorption, fluorescence, and diffraction, to yield chemical, elemental, and structural information about the sample, respectively. This makes X-ray microscopy attractive to many fields of science, ranging from physics and chemistry to materials, geo-, and environmental science, biomedicine, and nanotechnology. Our scanning microscope based on nanofocusing refractive X-ray lenses has a routine spatial resolution of about 100 nm and supports the contrast mechanisms mentioned above. In combination with coherent X-ray diffraction imaging, the spatial resolution can be improved to the 10 nm range. The current state-of-the-art of this technique is illustrated by several examples, and future prospects of the technique are given.

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Note: Record converted from VDB: 12.11.2012; Record converted from JUWEL: 18.07.2013

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  1. Terrestrische Umwelt (P24)

Appears in the scientific report 2010
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 Record created 2012-11-13, last modified 2020-04-23


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