Journal Article

FZJ-2017-07727

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png FEI Titan 80 - 300 TEM

Thust, A. (Corresponding author)FZJ* ; Barthel, J.FZJ*

2016
Forschungszentrum Jülich Jülich

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Please use a persistent id in citations: http://hdl.handle.net/2128/15962  doi:10.17815/jlsrf-2-66

Abstract: The FEI Titan 80-300 TEM is a high-resolution transmission electron microscope equipped with a field emission gun and a corrector for the spherical aberration (CS) of the imaging lens system. The instrument is designed for the investigation of a wide range of solid state phenomena taking place on the atomic scale, which requires true atomic resolution capabilities. Under optimum optical settings of the image CS-corrector (CEOS CETCOR) the point-resolution is extended up to the information limit of well below 100 pm with 200 keV and 300 keV electrons. A special piezo-stage design allows ultra-precise positioning of the specimen in all 3 dimensions. Digital images are acquired with a Gatan 2k x 2k slow-scan charged coupled device camera.

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Contributing Institute(s):

1. Materialwissenschaft u. Werkstofftechnik (ER-C-2)

Research Program(s):

1. 143 - Controlling Configuration-Based Phenomena (POF3-143) (POF3-143)

Appears in the scientific report 2017

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