Journal Article

FZJ-2022-00474

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png In situ spectroscopic ellipsometry as a pathway toward achieving VO 2 stoichiometry for amorphous vanadium oxide with magnetron sputtering

Xu, C. (Corresponding author) ; Heinemeyer, F. ; Dittrich, A. ; Bäumer, C.FZJ* ; Reineke-Koch, R.

2021
American Inst. of Physics New York, NY

This record in other databases:  

Please use a persistent id in citations: http://hdl.handle.net/2128/30179  doi:10.1063/5.0041116

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Contributing Institute(s):

1. Elektronische Materialien (PGI-7)
2. JARA-FIT (JARA-FIT)

Research Program(s):

1. 5233 - Memristive Materials and Devices (POF4-523) (POF4-523)

Appears in the scientific report 2021

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