IBN-1

⇦ Institut für Halbleiterschichten und Bauelemente   ⇧ IBN ⇧   Halbleiter-Nanoelektronik ⇨

Recent Publications

All known publications ...
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http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Journal Article Lüth, H. ; Apetz, R. ; Vescan, L.
Determination of the valence band offset of Si/Si0.7Ge0.3/Si quantum wells using deep level transient spectroscopy
Journal of applied physics 73(11), 7427 - 7430 (1993) [10.1063/1.353984]1993   Files  Fulltext by OpenAccess repository BibTeX | EndNote: XML, Text | RIS

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Journal Article Lüth, H. ; Dieker, C. ; Gerthsen, D. ; Lange, J. ; Förster, A.
The effect of growth temperature on AlAs/GaAs resonant tunnelling diodes
Journal of physics / D 27, 175 - 178 (1994) [10.1088/0022-3727/27/1/028]1994   Files  Fulltext by OpenAccess repository BibTeX | EndNote: XML, Text | RIS

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Journal Article Klyachkovskaya, E. ; Strekal, N. ; Motevich, I. ; Vaschenko, S. ; Harbachova, A. ; Belkov, M. ; Gaponenko, S. ; Dais, C. ; Sigg, H. ; Stoica, T.FZJ* ; Grützmacher, D.FZJ*
Enhanced Raman Scattering of Ultramarine on Au-coated Ge/Si-nanostructures
Plasmonics 6, 413 - 418 (2011) [10.1007/s11468-011-9219-2]2011 BibTeX | EndNote: XML, Text | RIS

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Journal Article Bringer, A. ; Schäpers, T.FZJ*
Spin precession and modulation in ballistic cylindrical nanowires due to the Rashba effect
Physical review / B 83(11), 115305 (2011) [10.1103/PhysRevB.83.115305]2011   Files  Fulltext by OpenAccess repository BibTeX | EndNote: XML, Text | RIS

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Journal Article Sarreshtedari, F. ; Razmkhah, S. ; Hosseini, N. ; Schubert, J.FZJ* ; Banzet, M.FZJ* ; Fardmanesh, M.
An Efficient SQUID NDE Defect Detection Approach by Using an Adaptive Finite-Element Modeling
Journal of superconductivity and novel magnetism 24, (2011) [10.1007/s10948-010-0860-3]2011 BibTeX | EndNote: XML, Text | RIS

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Journal Article Sedghi, N. ; Mitrovic, I. Z. ; Hall, S. ; Lopes, J. M. J.FZJ* ; Schubert, J.FZJ*
CV measurements on LaLuO3 stack metal-oxide-semiconductor capacitor using a new three-pulse technique
Journal of vacuum science & technology / B 29, 01AB03 (2011) [10.1116/1.3533267]2011 BibTeX | EndNote: XML, Text | RIS

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Journal Article Sofer, Z. ; Sedmidubský, D. ; Huber, S. ; Hejtmánek, J. ; Marysko, M. ; Jurek, K. ; Mikulics, M.FZJ*
Flux growth of ZnO crystals doped by transition metals
Journal of crystal growth 314, (2011) [10.1016/j.jcrysgro.2010.11.148]2011 BibTeX | EndNote: XML, Text | RIS

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Journal Article Lupták, R.FZJ* ; Lopes, J. M. J.FZJ* ; Lenk, S.FZJ* ; Holländer, B.FZJ* ; Durgun Özben, E.FZJ* ; Tiedemann, A. T.FZJ* ; Schnee, M.FZJ* ; Schubert, J.FZJ* ; Habicht, S.FZJ* ; Feste, S.FZJ* ; Mantl, S.FZJ* ; Breuer, U. ; Besmehn, A. ; Baumann, P. K. ; Heuken, M.
Atomic layer deposition of HfO2 and Al2O3 layers on 300 mm Si wafers for gate stack technology
Journal of vacuum science & technology / B 29, 01A301 (2011) [10.1116/1.3521374]2011 BibTeX | EndNote: XML, Text | RIS

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Contribution to a book Gomeniuk, Y. Y. ; Gomeniuk, Y. V. ; Nazarova, A. N. ; Hurley, P. K. ; Cherkaoui, K. ; Monaghan, S. ; Gottlob, H. D. B. ; Schmidt, M. ; Schubert, J.FZJ* ; Lopes, J. M. J.FZJ* ; Engström, O.
Electrical Properties of LaLuO3/Si(100) Structures Prepared by Molecular Beam Deposition
Pennington, NJ : Electrochemical Society (ECS), ECS transactions 33, 221 - 227 (2010) [10.1149/1.3481609]2010 BibTeX | EndNote: XML, Text | RIS

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Contribution to a book Durgun Özben, E.FZJ* ; Nichau, A.FZJ* ; Lopes, J. M. J.FZJ* ; Lenk, S.FZJ* ; Besmehn, A.FZJ* ; Bourdelle, K. K. ; Zhao, Q. T.FZJ* ; Schubert, J.FZJ* ; Mantl, S.FZJ*
Electrical characterization of TbScO3/TiN gate stacks in MOS capacitors and MOSFETs on strained and unstrained SOI
Pennington, NJ : Electrochemical Society (ECS), ECS transactions 33, 195 - 202 (2010) [10.1149/1.3481606]2010 BibTeX | EndNote: XML, Text | RIS

All known publications ...
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