Journal Article

PreJuSER-45392

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Comparison of in-plane and out-of-plane optical amplification in AFM measurements

Peter, F.FZJ* ; Rüdiger, A.FZJ* ; Waser, R.FZJ* ; Szot, K.FZJ* ; Reichenberg, B.

2005
American Institute of Physics [S.l.]

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Please use a persistent id in citations: http://hdl.handle.net/2128/1000  doi:10.1063/1.1878153

Abstract: The in-plane image of piezoresponse force microscopy (PFM) generally exhibits a higher resolution and less noise than the out-of-plane image. Geometrical considerations indicate that the optical in-plane amplification is approximate to 40 times larger than the out-of-plane amplification. We experimentally confirm this explanation in a dedicated setup. (C) American Institute of Physics.

Keyword(s): J

Note: Record converted from VDB: 12.11.2012

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Contributing Institute(s):

1. Elektronische Materialien (IFF-IEM)
2. Center of Nanoelectronic Systems for Information Technology (CNI)

Research Program(s):

1. Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik (I01)

Appears in the scientific report 2005
Notes: This version is available at the following Publisher URL: http://rsi.aip.org

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Database coverage:

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